DS1842

76V, APD, Bias Output Stage with Current Monitoring

DS1842 Combines with DS1843 to Improve Integration and Lower Cost in APD Biasing


Please check latest availability status for a specific part variant.

Description

The DS1842 integrates the discrete high-voltage components necessary for avalanche photodiode (APD) bias and monitor applications. A switch FET is used in conjunction with an external DC-DC controller to create a boost DC-DC converter. A current clamp limits current through the APD and also features an external shutdown. The device also includes a dual current mirror to monitor the APD current.
DS1842: Typical Application Circuit DS1842: Typical Application Circuit Enlarge+

Key Features

  • 76V Maximum Boost Voltage
  • Switch FET
  • Current Monitor with a Wide 1μA to 2mA Range, Fast 50ns Time Constant, and 10:1 and 5:1 Ratio
  • 2mA Current Clamp with External Shutdown
  • Multiple External Filtering Options
  • 3mm x 3mm, 14-Pin TDFN Package with Exposed Pad

Applications/Uses

  • APD Biasing
  • GPON Optical Network Unit and Optical Line Transmission
Part NumberPhoto Diode Appl.IDIODEIDIODEVBIAS
(V)
Package/PinsOper. Temp.
(°C)
Budgetary
Price
minmaxmaxSee Notes
DS1842 APD10µA4mA76
TDFN/14
-40 to +85$1.14 @1k
See All Fiber Photodiode Current Monitors (9)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Quality and Environmental Data

Product Reliability Reports: DS1842.pdf 
Lead-Free Package Tin (Sn) Whisker Reports

CAD Symbols and Footprints

  • DS1842N+
  • DS1842N+T&R
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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    Related Resources


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    05/29/2020 - 05/31/2020, Detroit, MI
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