DS3254DK

Quad DS3/E3/STS-1 LIU Demo Kit


Please check latest availability status for a specific part variant.

Description

The DS3254DK is an easy-to-use evaluation kit for the DS3254 quad DS3/E3/STS-1 LIU. A surfacemounted DS3254 and careful layout of the analog signal traces provide maximum signal integrity to demonstrate the transmit and receive capabilities of the DS3254. On-board Dallas 8051-compatible microcontroller and included software give point-andclick access to configuration and status registers from a personal computer. LEDs on the board indicate interrupt, loss-of-signal, transmit driver monitor, and PRBS sync status for all four ports. The board provides BNC connectors for the line-side transmit and receive differential pairs and a 50-pin connector for framer interface signals. All LEDs and connectors are clearly labeled with silk screening to identify associated signals.

Key Features

  • Soldered DS3254 for Best Signal Integrity
  • BNC Connectors, Transformers, and Termination Passives for All Four LIUs
  • Careful Layout for Analog Signal Paths
  • Equipment-Side Connector for External Data Source/Sink or External Remote Loopback
  • On-Board DS3 and E3 Crystal Oscillators
  • DS3254 Configured for CPU Bus Operation for Complete Control Over the Device
  • On-Board Dallas Microcontroller and Included Software Provide Point-and-Click Access to the DS3254 Register Set
  • LEDs for Interrupt, Loss-of-Signal, Transmit Driver Monitor, and PRBS Sync
  • Banana Jack Connectors for VDD and GND Support Use of Lab Power Supplies
  • Separate DS3254 VDD to Enable IDD Measurements
  • Easy-to-Read Silk Screen Labels Identify the Signals Associated with All Connectors, Jumpers and LEDs
  • Applications/Uses

    • Access Concentrators
    • ATM and Frame Relay Equipment
    • CSUs/DSUs
    • Digital Cross-Connects
    • DSLAMs
    • PBXs
    • Routers/Switches
    • SONET/SDH and PDH Multiplexers

    Quality and Environmental Data

    Request Reliability Report for: DS3254DK 
    Lead-Free Package Tin (Sn) Whisker Reports
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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