16/24/32kbps ADPCM Processor

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The DS2165 ADPCM processor chip is a dedicated digital-signal-processing (DSP) chip that has been optimized to perform adaptive differential pulse-code modulation (ADPCM) speech compression at three different rates. The chip can be programmed to compress (expand) 64kbps voice data down to (up from) either 32kbps, 24kbps, or 16kbps. The compression to 32kbps follows the algorithm specified by CCITT recommendation G.721 (July 1986) and ANSI document T1.301 (April 1987). The compression to 24kbps follows ANSI document T1.303. The compression to 16kbps follows a proprietary algorithm developed by Dallas Semiconductor. The DS2165 can switch compression algorithms on-the-fly. This allows the user to make maximum use of the available bandwidth on a dynamic basis.
DS2165, DS2165Q: Block Diagram DS2165, DS2165Q: Block Diagram Enlarge+

Key Features

  • Compresses/expands 64kbps PCM voice to/from either 32kbps, 24kbps, or 16kbps
  • Dual, fully independent channel architecture; device can be programmed to perform either:
    • two expansions
    • two compressions
    • one expansion and one compression
  • Interconnects directly to combo-codec devices
  • Input to output delay is less than 375µs
  • Simple serial port used to configure the device
  • On-board time-slot assigner-circuit (TSAC) function allows data to be input/output at various time slots
  • Supports channel associated signaling
  • Each channel can be independently idled or placed into bypass
  • Available hardware mode requires no host processor; ideal for voice storage applications
  • Backward-compatible with the DS2167 ADPCM processor chip
  • Single +5V supply; low-power CMOS technology
  • Available in 28-pin PLCC
  • 3V operation version is available (DS2165QL)
Request Reliability Report for: DS2165Q 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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