Design Kit for the DS21458 Quad T1/E1/J1 Transceiver Daughter Card

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The DS21458DK is an easy-to-use evaluation board for the DS21458 quad T1/E1/J1 transceiver. The DS21458DK is intended to be used as a daughter card with the DK101 motherboard or the DK2000 motherboard. The DS21458DK comes complete with a DS21458 quad SCT, transformers, termination resistors, configuration switches, line-protection circuitry, network connectors, and motherboard connectors. The DK101/DK2000 motherboard and Dallas' ChipView software give point-and-click access to configuration and status registers from a Windows®-based PC. On-board LEDs indicate receive loss-of-signal and interrupt status. An on-board FPGA contains mux logic to connect framer ports to one another or to the DK2000 in a variety of configurations.

Each DS21458DK is shipped with a free DK101 motherboard. For complex applications, the DK2000 high-performance demo kit motherboard can be purchased separately.

Key Features

  • Demonstrates Key Functions of DS21458 Quad T1/E1/J1 Transceiver
  • Includes DS21458 Quad LIU, Transformers, BNC and RJ45 Network Connectors, and Termination Passives
  • Compatible with DK101 and DK2000 Demo Kit Motherboards
  • DK101/DK2000 and ChipView Software Provide Point-and-Click Access to the DS21458 Register Set
  • All Equipment-Side Framer Pins are Easily Accessible for External Data Source/Sink
  • Memory-Mapped FPGA Provides Flexible Clock/Data/Sync Connections Among Framer Ports and DK2000 Motherboard
  • LEDs for Loss-of-Signal and Interrupt Status
  • Easy-to-Read Silk Screen Labels Identify the Signals Associated with all Connectors, Jumpers, and LEDs
  • Network Interface Protection for Overvoltage and Overcurrent Events

Additional Resources

Support Files

Tools & Models

  • DS21458DK Gerber File
  • Request Reliability Report for: DS21458DK 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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