DS1672

I²C 32-Bit Binary Counter RTC

Low-Voltage, Serial Timekeeping Chip Combines an Ultra-Low-Voltage Clock with Sophisticated Power-Monitoring Circuitry, Power-Fail Switches, and a Switch to Optional Trickle-Charging, Replacing Several Discrete Components with One Chip


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Description

The DS1672 low-voltage serial timekeeping chip incorporates a 32-bit counter and power-monitoring functions. The 32-bit counter is designed to count seconds and can be used to derive time-of-day, week, month, and year by using a software algorithm. A precision, temperature-compensated reference and comparator circuit monitors the status of VCC. When an out-of-tolerance condition occurs, an internal power-fail signal is generated that forces the reset to the active state. When VCC returns to an in-tolerance condition, the reset signal is kept in the active state for 250ms to allow the power supply and processor to stabilize.
DS1672: Typical Operating Circuit DS1672: Typical Operating Circuit Enlarge+

Key Features

  • 32-Bit Counter
  • I²C Serial Interface
  • Automatic Power-Fail Detect and Switch Circuitry
  • Power-Fail Reset Output
  • Low-Voltage Oscillator Operation (1.3V min)
  • Trickle-Charge Capability
Part NumberInterfaceVSUPPLY
(V)
Time Keeping Current
(nA)
CL
(pF)
Memory TypeTime of Day AlarmsFunctionsPackage/PinsBudgetary
Price
typSee Notes
DS1672 I2C
2
3
3.3
4256None0
Elapsed Time Counter
RTC
PDIP/8
SOIC (N)/8
UMAX/8
$1.30 @1k
See All Timekeeping & Real-Time Clocks (77)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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