MAX5216LPT

Evaluation Kit for the Reference Design of 4-20mA Loop-Powered Transmitter


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Description

The MAX5216LPT evaluation kit (EV kit) enables evaluation of the loop-powered 4–20mA current-loop transmitter with the fault current-limiting capabilities and Highway Addressable Remote Transducer (HART) modem input/output ready, which utilizes the MAX5216 single-channel, low-power, buffered-output, 3-wire SPI interface 16-bit DAC, the MAX6133 3ppm/°C, low-power voltage reference, the MAX9620 single-channel, zero-drift, high-efficiency op amp with RRIO, and the MAX15007 40V, ultra-low quiescent current LDO. The EV kit also includes Windows XP®, Windows Vista® and Windows® 7-compatible software that provides a simple graphical-user interface (GUI) for exercising the features of this reference design.

Key Features

  • Wide 12V to 40V Input Supply Range
  • Transfer 16-Bit Digital Code to 4–20mA Loop Current
  • Offset and Gain Programmable
  • < 0.02 % FS Current Error at +25°C
  • < 0.1 % FS Current Error Over Temperature Range
  • -40°C to +105°C Temperature Range
  • 30mA ±20% Resistor-Selectable Current Limiting
  • 200µA (typ), 300µA (max) Quiescent Current
  • HART Modem Input and Output Ready
  • Direct USB Communication through the MAXQ622 Microcontroller
  • Windows XP-, Windows Vista-, and Windows 7 (32-Bit)-Compatible Software
  • SPI Interface Terminals
  • Proven PCB Layout
  • Fully Assembled and Tested

Applications/Uses

  • 2-Wire Sensors
  • Automatic Test Equipment
  • Automatic Tuning
  • Communication Systems
  • Gain and Offset Adjustment
  • Portable Instrumentation
  • Power Amplifier Control
  • Process Control and Servo Loops
  • Programmable Voltage and Current Sources

Quality and Environmental Data

Request Reliability Report for: MAX5216LPT 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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