Pin-/Software-Compatible, 16-/12-Bit, Voltage-Output DACs

Industry's Smallest 16-Bit DAC with Pin-Programmable Zero or Midscale Power-Up

Please check latest availability status for a specific part variant.


The MAX5134–MAX5137 is a family of pin-compatible and software-compatible 16-bit and 12-bit DACs. The MAX5134/MAX5135 are low-power, quad 16-/12-bit, buffered voltage-output, high-linearity DACs. The MAX5136/MAX5137 are low-power, dual 16-/12-bit, buffered voltage-output, high-linearity DACs. They use a precision internal reference or a precision external reference for rail-to-rail operation. The MAX5134–MAX5137 accept a wide +2.7V to +5.25V supply-voltage range to accommodate most low-power and low-voltage applications. These devices accept a 3-wire SPI-/QSPI-/MICROWIRE®-/DSP-compatible serial interface to save board space and reduce the complexity of optically isolated and transformer-isolated applications. The digital interface’s double-buffered hardware and software active-low LDAC provide simultaneous output updates. The serial interface features an active-low READY output for easy daisy-chaining of several MAX5134–MAX5137 devices and/or other compatible devices. The MAX5134–MAX5137 include a hardware input to reset the DAC outputs to zero or midscale upon power-up or reset, providing additional safety for applications that drive valves or other transducers that need to be off during power-up. The high linearity of the DACs makes these devices ideal for precision control and instrumentation applications. The MAX5134–MAX5137 are available in an ultra-small (4mm x 4mm), 24-pin TQFN package or a 16-pin TSSOP package. Both packages are specified over the -40°C to +105°C extended industrial temperature range.

MAX5134, MAX5135, MAX5136, MAX5137: Typical Operating Circuit MAX5134, MAX5135, MAX5136, MAX5137: Typical Operating Circuit Enlarge+

Key Features

  • 16-/12-Bit Resolution Available in a 4mm x 4mm, 24-Pin TQFN Package or 16-Pin TSSOP
  • Hardware-Selectable to Zero/Midscale DAC Output on Power-Up or Reset
  • Double-Buffered Input Registers
  • Active-Low LDAC Asynchronously Updates DAC Outputs Simultaneously
  • Active-Low READY Facilitates Daisy Chaining
  • High-Performance 10ppm/°C Internal Reference
  • Guaranteed Monotonic Over All Operating Conditions
  • Wide +2.7V to +5.25V Supply Range
  • Rail-to-Rail Buffered Output Operation
  • Low Gain Error (Less Than ±0.5%FS) and Offset (Less Than ±10mV)
  • 30MHz 3-Wire SPI-/QSPI-/MICROWIRE-/DSP-Compatible Serial Interface
  • CMOS-Compatible Inputs with Hysteresis
  • Low-Power Consumption (ISHDN = 2µA max)


  • Automatic Test Equipment
  • Automatic Tuning
  • Communication Systems
  • Data Acquisition
  • Gain and Offset Adjustment
  • Portable Instrumentation
  • Power-Amplifier Control
  • Process Control and Servo Loops
  • Programmable Voltage and Current Sources

See parametric specs for Precision DACs (247)

Part NumberResolution
ChannelsOutput TypeReferenceINL
InterfaceSupply Range
Supply Range
Settling Time
Package/PinsOper. Temp.
maxminmaxmaxtypSee Notes
MAX5134 164Voltage- BufferedInt./Ext.10Serial - SPI2.75.53.65
-40 to +105$7.30 @1k
MAX5135 12412.3
$5.06 @1k
MAX5136 16283.6
$4.15 @1k
MAX5137 12212.3
$2.70 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX5134EVKIT: Evaluation Kit for the MAX5134, MAX5135, MAX5136, and MAX5137
MAXSPCSPARTAN6: Evaluation Kit for the MAX5135, MAX11040, and MAX11612
Product Reliability Reports: MAX5136.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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