MAX5426

Precision Resistor Network for Programmable Instrumentation Amplifiers


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Description

The MAX5426 is a precision resistor network optimized for use with programmable instrumentation amplifiers. The MAX5426 operates from dual ±5V to ±15V supplies and consumes less than 40µA of supply current. Designed to be used in the traditional three op amp instrumentation amplifier topology, this device provides noninverting gains of 1, 2, 4, and 8 that are accurate to 0.025% (A-grade), 0.09% (B-grade), or 0.5% (C-grade) over the extended temperature range (-40°C to +85°C). The MAX5426 is available in the 6.4mm x 5mm 14-pin TSSOP package.
MAX5426: Typical Operating Circuit MAX5426: Typical Operating Circuit Enlarge+

Key Features

  • Differential Gains: AV = 1, 2, 4, 8
  • Gain Accurate to 0.025%, 0.09%, or 0.5%
  • Dual Supply ±5V to ±15V Operation
  • Low 36µA Supply Current
  • Simple CMOS/TTL Logic Compatible 2-Wire Parallel Interface
  • Space-Saving 14-Pin TSSOP Package (6.4mm x 5mm)
  • OFFSET Pin Available to Offset the Output of the Differential Amplifier

Applications/Uses

  • Gain Control in RF Power Amplifiers
  • General-Purpose Programmable Instrumentation Amplifiers
  • Precision Dual Attenuator
Part NumberPOTsControl InterfaceWiper MemoryStepsREND-TO-END
(kΩ)
Res. Tol.
(%)
Temp. Coeff.
(ppm/°C)
ICC @5V
(µA)
Package/PinsBudgetary
Price
typmaxSee Notes
MAX5426 12-Wire ParallelVolatile4150.0253590
TSSOP/14
$3.87 @1k
See All Digital Potentiometers (120)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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