Nonvolatile, 32-Position Digital Potentiometer

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The DS4301 is a single 32-position linear digital potentiometer with 200kΩ end-to-end resistance. The wiper setting is stored in EEPROM, so the DS4301 powers up with the last stored setting. The position of the wiper is controlled through a simple three-terminal increment/decrement interface. The DS4301 is ideal for white LED backlight brightness control. Its 8-pin µSOP package, 2.4V to 5.5V supply range, and 200kΩ end-to-end resistance are especially suited for portable, battery-powered applications such as cellular telephones and PDAs.
DS4301: Typical Operating Circuit DS4301: Typical Operating Circuit Enlarge+

Key Features

  • Single, 32-Position, 200kΩ Linear Nonvolatile (NV) Potentiometer Ideal for Battery-Powered Applications
  • Three-Terminal Increment/Decrement Interface to Adjust Wiper Position
  • Wide Voltage Supply Range (2.4V to 5.5V)
  • Command-Initiated NV Wiper Storage
  • Operates Over the Industrial Temperature Range (-40°C to +85°C)
  • Available in 8-Pin µSOP


  • Any Application that Requires a Small, Low-Cost NV Potentiometer
  • Portable Battery-Powered Devices such as PDAs and Cellular Phones
  • White LED Backlight Brightness Control

See parametric specs for Digital Potentiometers (118)

Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
Res. Tol.
Temp. Coeff.
Wiper Resistance
typtypmaxSee Notes
DS4301 Linear1Up/DownNon-Volatile322002025050060
SOIC (N)/8
$0.63 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS4301.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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