Hex Nonvolatile Potentiometer with I/O and Memory

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The DS3930 contains six 256-position nonvolatile (NV) potentiometers, 64 bytes of NV user EEPROM memory, and four programmable NV I/O pins. The six potentiometers all share a common low side. The potentiometers are separated into two groups of three 50kΩ potentiometers in parallel. Each group of three potentiometers shares a common high side and forms an equivalent resistance of 16.6kΩ (three 50kΩ potentiometers in parallel).
DS3930: Typical Operating Circuit DS3930: Typical Operating Circuit Enlarge+

Key Features

  • Six 256-Position NV Potentiometers
  • Four General-Purpose NV I/O Pins
  • 64 Bytes of User EEPROM Memory
  • 0 to 5.5V on Any Potentiometer Terminal, Independent of VCC
  • All Six Potentiometers Share a Common Low Side
  • Potentiometers Separated into Two Groups of Three Potentiometers, Each Sharing a Common High Side
  • 2-Wire Serial Interface
  • Wide Supply Range (2.7V to 5.5V)
  • Up to Eight DS3930s Can Share the Same 2-Wire Bus


  • Fiber Optic Transceiver Modules
  • Mobile Phones and PDAs
  • Portable Electronics
  • Power Supply Calibration
  • Radio Tuners
  • RF Transceivers
  • Small, Low-Cost Replacement for Mechanical Potentiometers Features
  • Voltage References

See parametric specs for Digital Potentiometers (117)

Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
Res. Tol.
Temp. Coeff.
Wiper Resistance
typtypmaxSee Notes
DS3930 Linear62-Wire AddressableNon-Volatile25616.620250400350
$2.33 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS3930.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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