DS3903

Triple 128-Position Nonvolatile Digital Potentiometer

Lowest Cost Nonvolatile Triple Potentiometer Ideal for Automating Power-Supply Calibration Eliminates Manual Factory Calibration Costs


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Description

The DS3903 contains three nonvolatile (NV) low temperature coefficient digital potentiometers, which can be accessed through a 2-wire bus. The DS3903 operates in both 3V and 5V systems, and it features a write-protect pin that can lock the positions of the potentiometers. An address pin allows two DS3903s to be placed on the same 2-wire bus.
DS3903: Typical Operating Circuit DS3903: Typical Operating Circuit Enlarge+

Key Features

  • Three 128-Position Linear Potentiometers (Two 10kΩ, One 100kΩ)
  • NV Wiper Storage
  • Low End-to-End Temperature Coefficient
  • Operates on an Industry-Standard 2-Wire Bus
  • Write-Protect Pin
  • Supply Range: 3V or 5V
  • Operating Temperature Range: -40°C to +85°C
  • Packaging: 20-Pin TSSOP

Applications/Uses

  • A Small and Low-Cost Replacement for Mechanical Potentiometers
  • Fiber Optic Transceiver Modules
  • Mobile Phones and PDAs
  • Portable Electronics
  • Power Supply Calibration

See parametric specs for Digital Potentiometers (118)


Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
(kΩ)
Res. Tol.
(%)
Temp. Coeff.
(ppm/°C)
Wiper Resistance
(Ω)
ICC @5V
(µA)
Package/PinsBudgetary
Price
typtypmaxSee Notes
DS3903 Linear32-Wire AddressableNon-Volatile12810+10+9020300250250
TSSOP/20
$1.22 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS3903.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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