High-Voltage NV I²C Potentiometer with Temperature Sensor and LUT

Provides a VCOM Calibrator Solution for TFT-LCD Panels

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The DS3501 is a 7-bit, nonvolatile (NV) digital potentiometer featuring an output voltage range of up to 15.5V. Programming is accomplished by an I²C-compatible interface, which can operate at speeds of up to 400kHz. External voltages are applied at the RL and RH inputs to define the lowest and highest potentiometer outputs.

The DS3501 contains an on-chip temperature sensor and associated analog-to-digital converter (ADC). The ADC output addresses a 36-byte NV lookup table (LUT). The LUT output can drive the pot directly or be added to an NV initial-value register (IVR) to drive the pot. This flexible LUT-based architecture allows the DS3501 to provide a temperature-compensated potentiometer output with arbitrary slope.
DS3501: Functional Diagram DS3501: Functional Diagram Enlarge+

Key Features

  • 128 Wiper Tap Points
  • Full-Scale Resistance: 10kΩ
  • On-Chip Temperature Sensor and ADC
  • 36-Byte Lookup Table (LUT)
  • I²C-Compatible Serial Interface
  • Address Pins Allow Up to Four DS3501s to Share the Same I²C Bus
  • Digital Operating Voltage: 2.7V to 5.5V
  • Analog Operating Voltage: 4.5V to 15.5V
  • Operating Temperature: -40°C to +100°C
  • Pin and Software Compatible with ISL95311 (Default Mode)
  • 10-Pin µSOP Package

See parametric specs for Digital Potentiometers (118)

Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
Res. Tol.
Temp. Coeff.
Wiper Resistance
typtypmaxSee Notes
DS3501 Linear1I2CNon-Volatile12810204500060
$0.61 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS3501.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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