DS1854EVKIT

Evaluation Kit for the DS1854, DS1857, DS1858, and DS1859 Fiber Optic Monitor and Control Evaluation Kit

Fiber Optic Monitor and Control Evaluation Kit


Please check latest availability status for a specific part variant.

Description

The fiber optic monitor and control evaluation kit (EV kit) provides a hardware and software interface for evaluating the DS1854, DS1857, DS1858, and DS1859. The kit includes Microsoft Windows®-compatible software that performs the 2-wire functions required to change the device settings and monitor the device registers. In addition to the general communications functions provided by the software, it allows the resistors' temperature-addressed look-up tables to be programmed from a text file. The kit hardware includes test points that allow inputs to be connected to the external stimuli and outputs to be monitored by test equipment; jumpers can be used to configure the device for the customer's application.
DS185XEVKIT: Typical Application Circuit DS185XEVKIT: Typical Application Circuit Enlarge+

Key Features

  • Supports DS1854, DS1857, DS1858, and DS1859
  • Windows Software Allows Easy Access to Device Functionality and Handles 2-Wire Communication
  • ZIF Socket Allows All Four Device Types to be Evaluated from a Single Board
  • Software Allows User to Program Variable Resistors from a Text File
  • Real-Time Monitoring Software Continuously Monitors Temperature, VCC, Monitor Inputs, and Status Bytes
  • External Temperature Sensor Footprint for Evaluating the DS1857
  • EV Kit's Software can be Used to Configure or Monitor the Device in a Customer's Application Circuit

Applications/Uses

  • Diagnostic Monitoring
  • Instrumentation and Industrial Controls
  • Optical Transceivers
  • Optical Transponders
  • RF Power Amps
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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