Addressable Dual Audio Taper Potentiometer

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The DS1807 consists of two addressable potentiometers having a logarithmic resistor characteristic over the device range. Each potentiometer provides 64 wiper positions with a 1dB-per-step resolution. The device also provides greater than 90dB of attenuation in the mute position. Zero-crossing detection is a primary feature of the DS1807 allowing for pop-free wiper transitions. Wiper positions are read and controlled via a 2-wire interface, which allows up to 8 devices to be controlled on the same 2-wire bus.

The DS1802 provides high-performance audio volume and tone control with processor addressability. It replaces mechanical potentiometers with digital accuracy and reliability while its low-power circuits consume very little current.
DS1807: Block Diagram DS1807: Block Diagram Enlarge+

Key Features

  • Operates from 3V or 5V power supplies
  • Ultra low-power consumption
  • Dual digitally controlled, 65-position potentiometers
  • Logarithmic resistance characteristic (1dB per step)
  • Zero crossing eliminates noise caused by discrete wiper changes
  • 2-wire addressable control interface
  • Industrial operating temperature range: -40°C to +85°C

See parametric specs for Digital Potentiometers (118)

Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
Res. Tol.
Temp. Coeff.
Wiper Resistance
typtypmaxSee Notes
DS1807 Log22-Wire AddressableVolatile64452075040040
SOIC (W)/16
$3.30 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS1807.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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