Nonvolatile Trimmer Potentiometer

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The DS1804 NV trimmer potentiometer is a nonvolatile digital potentiometer that has 100 positions. The device provides an ideal method for low-cost trimming applications using a CPU or manual control input with minimal external circuitry. Wiper position of the DS1804 can be stored in EEPROM memory on demand. The device's wiper position is manipulated by a three-terminal port that provides an increment/ decrement counter controlled interface. This port consists of the control inputs active-low CS, active-low INC, and U/active-low D. The DS1804 is available in three resistor grades, which include a 10kΩ, 50kΩ, and 100kΩ. The device is provided in an industrial temperature grade. Additionally, the DS1804 will operate from 3V or 5V supplies and is ideal for portable application requirements. Three packaging options are available and include the 8-pin (300 mils) DIP, 8-pin (150 mils) SO, and 8-pin (118 mils) µSOP.
DS1804: Block Diagram DS1804: Block Diagram Enlarge+

Key Features

  • Single 100-Position Taper Potentiometer
  • Nonvolatile (NV) On-Demand Wiper Storage
  • Operates from 3V or 5V Supplies
  • Up/Down, Increment-Controlled Interface
  • Available in 8-Pin (300 mils) DIP, 8-Pin (150 mils) SO, and 8-Pin (118 mils) µSOP
  • -40°C to +85°C Operating Temperature Range
  • Standard Resistance Values:
    • DS1804-010: 10kΩ
    • DS1804-050: 50kΩ
    • DS1804-100: 100kΩ

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: DS1804.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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