DS1803

Addressable Dual Digital Potentiometer


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Description

The DS1803 addressable dual digital potentiometer features two independently controlled 256-position potentiometers. Device control is achieved through a 2-wire serial interface. Three address pins allow up to 8 DS1803's to share the same 2-wire interface. The exact wiper position of each potentiometer can be written or read. The DS1803 is available in a 16-pin DIP, 16-pin SO, and 14-pin TSSOP package. The device is available in three standard resistance values: 10kΩ, 50kΩ, and 100kΩ and is specified over the industrial temperature range.
DS1803: Block Diagram DS1803: Block Diagram Enlarge+

Key Features

  • 3V or 5V Operation
  • Ultra-Low Power Consumption
  • Two Digitally Controlled, 256- Potentiometers
  • 14-Pin TSSOP (173 mil) and 16- mil) Packaging Available for Surface- Applications
  • Addressable Using 3 Address
  • 2-Wire Serial Interface
  • Operating Temperature Range:
    • Industrial: -40°C to +85°C
  • Standard Resistance Values:\x02
    • DS1803-010 10kΩ
    • DS1803-050 50kΩ
    • DS1803-100 100kΩ
Part NumberTaperPOTsControl InterfaceWiper MemoryStepsREND-TO-END
(kΩ)
Res. Tol.
(%)
Temp. Coeff.
(ppm/°C)
Wiper Resistance
(Ω)
ICC @5V
(µA)
Package/PinsBudgetary
Price
typtypmaxSee Notes
DS1803 Linear22-Wire AddressableVolatile256
10
50
100
2075040040
PDIP(N)/16
SOIC(N)/16
TSSOP/14
$3.13 @1k
See All Digital Potentiometers (124)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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