MAX7651

Flash Programmable 12-Bit Integrated Data-Acquisition Systems


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Description

The MAX7651/MAX7652 are complete 12-bit data-acquisition systems featuring an algorithmic, switched-capacitor, analog-to-digital converter (ADC), a pulse- width-modulated digital-to-analog converter (DAC), three timer/counters, and an industry-standard 8051 microprocessor core with a variety of I/O peripherals. Power-down capability and full functionality with supply voltages as low as +3V make the MAX7651/MAX7652 suitable for portable and power-sensitive applications.

The MAX7651/MAX7652 perform fully differential voltage measurements with 12-bit resolution, programmable gain, and separate track-and-hold for both positive and negative inputs. The converter accepts versatile input modes consisting of four 2-channel signal pairs or eight 1-channel signals relative to a floating common.

The MAX7651/MAX7652 microprocessor systems feature a CPU, 256 bytes of RAM, two 8kB flash memory, four 8-bit I/O ports, two UARTs, an interrupt controller, and a watchdog timer. Only four clock cycles are required to complete each microprocessor instruction.

The MAX7651/MAX7652 are available in 64-pin TQFP packages.
MAX7651, MAX7652: Functional Diagram MAX7651, MAX7652: Functional Diagram Enlarge+

Key Features

  • 12-Bit 53ksps ADC with Fully Differential Inputs
  • Dual 8-Bit PWM DAC Outputs
  • Three Timers
  • 4-Clock Cycle 8051-Compatible Instruction Set with Dual Data Pointers
  • Programmable Watchdog Supervisor
  • Four Parallel I/O Ports
  • Dual Serial I/O Ports (up to 375kb)
  • +3V or +5V Single-Supply Operation
  • DC to 12MHz Clock Speed
  • 64-Pin TQFP Package

Applications/Uses

  • Data Logging
  • Handheld Instruments (PDAs, Palmtops)
  • Multi-Channel Data-Acquisition with Data Formatting
  • Portable Data-Acquisition Systems
  • Smart Transmitters
  • Temperature Control

MAX7651EVKIT: Evaluation Kit for the MAX7651
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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