4Msps, 3V, 2-Channel, True-Differential, 10-Bit ADC

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The MAX1335 2-channel, serial-output, 10-bit, analog-to-digital converter (ADC) features two true-differential analog inputs and offers outstanding noise immunity and dynamic performance. The device easily interfaces with SPI™/QSPI™/MICROWIRE™ and standard digital signal processors (DSPs).

The MAX1335 operates from a single +2.7V to +3.6V supply with sampling rates up to 4Msps. This device features a partial power-down mode and a full power-down mode that reduces the supply current to 3.3mA and 0.2µA, respectively. Also featured is a separate power-supply input (DVDD) that allows direct interfacing to +2.7V to +3.6V digital logic. The fast conversion speed, low power dissipation, excellent AC performance, and DC accuracy (±0.4 LSB INL) make the MAX1335 ideal for industrial process control, motor control, and base-station applications.

The MAX1335 is available in a space-saving (3mm x 3mm), 16-pin, TQFN package and operates over the extended (-40°C to +85°C) temperature range.

Key Features

  • 4Msps Sampling Rate (+3V, MAX1335)
  • Separate Logic Supply: +2.7V to +3.6V
  • Two True-Differential Analog Input Channels
  • Bipolar/Unipolar Selection Input
  • Only 40mW (typ) Power Consumption
  • Only 2µA (max) Shutdown Current
  • High-Speed, SPI-Compatible, 3-Wire Serial Interface
  • 2.6MHz Full-Linear Bandwidth
  • 61dB SINAD at 525kHz Input Frequency
  • No Pipeline Delays
  • Space-Saving (3mm x 3mm), 16-Pin TQFN Package


  • Base Stations
  • Bill Validation
  • Data Acquisition
  • High-Speed Modems
  • Industrial Process Control
  • Motor Control
  • Optical Sensors

Quality and Environmental Data

Request Reliability Report for: MAX1335 
Lead-Free Package Tin (Sn) Whisker Reports

Additional Resources

New Product Press Release 2005-08-22
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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Related Resources

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