14-Bit, 65Msps, 3.3V ADC

14-Bit and 12-Bit, 40Msps to 80Msps ADC Family Offers High Dynamic Performance from Baseband to Beyond 175MHz

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The MAX12553 is a 3.3V, 14-bit, 65Msps analog-to-digital converter (ADC) featuring a fully differential wideband track-and-hold (T/H) input amplifier, driving a low-noise internal quantizer. The analog input stage accepts single-ended or differential signals. The MAX12553 is optimized for low-power, small size, and high dynamic performance. Excellent dynamic performance is maintained from baseband to input frequencies of 175MHz and beyond, making the MAX12553 ideal for intermediate-frequency (IF) sampling applications.

Powered from a single 3.15V to 3.60V supply, the MAX12553 consumes only 363mW while delivering a typical signal-to-noise (SNR) performance of 71dB at an input frequency of 175MHz. In addition to low operating power, the MAX12553 features a 150µW powerdown mode to conserve power during idle periods.

A flexible reference structure allows the MAX12553 to use the internal 2.048V bandgap reference or accept an externally applied reference. The reference structure allows the full-scale analog input range to be adjusted from ±0.35V to ±1.10V. The MAX12553 provides a common-mode reference to simplify design and reduce external component count in differential analog input circuits.

The MAX12553 supports both a single-ended and differential input clock drive. Wide variations in the clock duty cycle are compensated with the ADC's internal duty-cycle equalizer (DCE).

ADC conversion results are available through a 14-bit, parallel, CMOS-compatible output bus. The digital output format is pin selectable to be either two's complement or Gray code. A data-valid indicator eliminates external components that are normally required for reliable digital interfacing. A separate digital power input accepts a wide 1.7V to 3.6V supply, allowing the MAX12553 to interface with various logic levels.

The MAX12553 is available in a 6mm x 6mm x 0.8mm, 40-pin thin QFN package with exposed paddle (EP), and is specified for the extended industrial (-40°C to +85°C) temperature range.

See a parametric table of the complete family of pin-compatible, 12-/14-bit high-speed ADCs.
MAX12553: Functional Diagram MAX12553: Functional Diagram Enlarge+

Key Features

  • Direct IF Sampling Up to 400MHz
  • Excellent Dynamic Performance
    • 74.0dB/71dB SNR at fIN = 3MHz/175MHz
    • 90.6dBc/80.7dBc SFDR at fIN = 3MHz/175MHz
  • Low Noise Floor: -76dBFS
  • 3.3V Low-Power Operation
    • 337mW (Single-Ended Clock Mode)
    • 363mW (Differential Clock Mode)
    • 150µW (Power-Down Mode)
  • Fully Differential or Single-Ended Analog Input
  • Adjustable Full-Scale Analog Input Range: ±0.35V to ±1.10V
  • Common-Mode Reference
  • CMOS-Compatible Outputs in Two's Complement or Gray Code
  • Data-Valid Indicator Simplifies Digital Design
  • Data Out-of-Range Indicator
  • Miniature, 40-Pin Thin QFN Package with Exposed Paddle
  • Evaluation Kit Available (Order MAX12555EVKIT)


  • IF and Baseband Communication Receivers: Cellular, Point-to-Point Microwave, HFC, WLAN
  • Low-Power Data Acquisition
  • Portable Instrumentation
  • Ultrasound and Medical Imaging

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX12553EVKIT: Evaluation Kit for the MAX12553, MAX12554, and MAX12555
MAX12554EVKIT: Evaluation Kit for the MAX12553, MAX12554, and MAX12555
MAX12555EVKIT: Evaluation Kit for the MAX12553, MAX12554, and MAX12555
Product Reliability Reports: MAX12553.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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