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MAX11905EVKIT

MAX11905EVKIT

Evaluation Kit for the MAX11900, MAX11901, MAX11902, MAX11903, MAX11904, and MAX11905

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Overview

Description

The MAX11905 evaluation kit (EV kit) demonstrates the MAX11905, 20-bit, 1.6Msps, single-channel, fully differential SAR ADC with internal reference buffers. The EV kit includes a graphical user interface (GUI) that provides communication from the Avnet ZedBoard™ development board for the Xilinx® Zynq®-7000 SoC.

The ZedBoard communicates with the PC through an Ethernet cable using Windows XP®-, Windows Vista®-, Windows® 7-, or Windows 8/8.1-compatible software.

The EV kit comes with the MAX11905ETP+ installed.

Please contact the factory for the pin-compatible MAX11900ETP+ (16-bit, 1Msps), MAX11901ETP+ (16-bit, 1.6Msps), MAX11902ETP+ (18-bit, 1Msps), MAX11903ETP+ (18-bit, 1.6Msps), and MAX11904ETP+ (20-bit, 1Msps)
MAX11905EVKIT: System Block Diagram MAX11905EVKIT: System Block Diagram Enlarge+

Key Features

  • Peripheral Module and FMC Connector for Interface
  • 75MHz SPI Clock Capability through FMC Connector
  • 37.5MHz SPI Clock Capability through Peripheral Module Connector
  • Sync In and Sync Out for Coherent Sampling
  • On-Board Input Buffers (MAX9632)
  • On-Board +3.0V Reference Voltage (MAX6126)
  • Windows XP-, Windows Vista-, Windows 7-, and Windows 8/8.1-Compatible Software

Applications/Uses

  • Automatic Test Equipment
  • Battery-Powered Equipment
  • Data Acquisition Systems
  • Medical Instrumentation
  • Process Control and Industrial Automation
  • Telecommunications
  • Test and Measurement

Design Resources

Technical Documents

App Note 6488 Achieving Desired Dynamic Performance in High-Speed, High-Resolution ADCs with Level Translators/Isolators in the System
App Note 6034 How to Select and Design Amplifier Buffer and Passive Components to Optimize Performance for the MAX11905 Evaluation Kits

Quality and Environmental Data

Lead-Free Package Tin (Sn) Whisker Reports

Tools & Models

  • MAX11905EVKIT Gerber File

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    Quality And Environmental

    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >

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    Related Resources

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    Technical Docs