MAX1190

Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC with Internal Reference and Parallel Outputs

Dual 10-Bit ADC Delivers Excellent Dynamic Performance at Low Power


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Description

The MAX1190 is a 3.3V, dual 10-bit analog-to-digital converter (ADC) featuring fully differential wideband track-and-hold (T/H) inputs, driving two ADCs. The MAX1190 is optimized for low power, small size, and high-dynamic performance for applications in imaging, instrumentation, and digital communications. This ADC operates from a single 3.1V to 3.6V supply, consuming only 492mW while delivering a typical signal-to-noise and distortion (SINAD) of 57dB at an input frequency of 60MHz and a sampling rate of 120Msps. The T/H driven input stages incorporate 400MHz (-3dB) input amplifiers. The converters can also be operated with single-ended inputs. In addition to low operating power, the MAX1190 features a 3mA sleep mode, as well as a 1µA power-down mode to conserve power during idle periods.

An internal 2.048V precision bandgap reference sets the full-scale range of the ADC. A flexible reference structure allows the use of this internal or an externally applied reference, if desired, for applications requiring increased accuracy or a different input voltage range.

The MAX1190 features parallel, CMOS-compatible three-state outputs. The digital output format can be set to two's complement or straight offset binary through a single control pin. The device provides for a separate output power supply of 1.7V to 3.6V for flexible interfacing with various logic families. The MAX1190 is available in a 7mm x 7mm, 48-pin TQFP-EP package, and is specified for the extended industrial (-40°C to +85°C) temperature range.

Pin-compatible lower speed versions of the MAX1190 are also available. Refer to the MAX1180–MAX1184 data sheets for 105Msps/80Msps/65Msps/40Msps. In addition to these speed grades, this family includes two multiplexed output versions (MAX1185/MAX1186 for 20Msps/40Msps), for which digital data is presented time-interleaved and on a single, parallel 10-bit output port.

For lower speed, pin-compatible, 8-bit versions of the MAX1190, refer to the MAX1195–MAX1198 data sheets.
MAX1190: Functional Diagram MAX1190: Functional Diagram Enlarge+

Key Features

  • Single 3.3V Operation
  • Excellent Dynamic Performance
    • 57dB SINAD at fIN = 60MHz
    • 64dBc SFDR at fIN = 60MHz
  • -71dBc Interchannel Crosstalk at fIN = 60MHz
  • Low Power
    • 492mW (Normal Operation)
    • 10mW (Sleep Mode)
    • 3.3µW (Shutdown Mode)
  • 0.08dB Gain and 0.8° Phase Matching
  • Wide ±1VP-P Differential Analog Input Voltage Range
  • 400MHz -3dB Input Bandwidth
  • On-Chip 2.048V Precision Bandgap Reference
  • User-Selectable Output Format—Two's Complement or Offset Binary
  • Pin-Compatible, Lower-Speed, 10-Bit and 8-Bit Versions Available

Applications/Uses

  • Baseband I/Q Sampling
  • Battery-Powered Instrumentation
  • Multichannel IF Sampling
  • Set-Top Boxes
  • Ultrasound and Medical Imaging
  • VSAT Terminals
  • WLAN, WWAN, WLL, MMDS Modems

See parametric specs for High-Speed ADCs (> 5Msps) (49)


Part NumberInput ChannelsResolution
(bits)
Sample Rate
(Msps)
SFDR
(dBc)
SINAD
(dB)
SNR
(dB)
THD
(dB)
DNL
(±LSB)
INL
(±LSB)
Full Pwr. BW
(MHz)
Data Bus InterfacePackage/PinsBudgetary
Price
maxminminSee Notes
MAX1190 2101206757.558.5-650.663400µP/10
TQFP/48
$26.31 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: MAX1190.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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