MAX11616EVSYS

Evaluation System for the MAX11600–MAX11617


Please check latest availability status for a specific part variant.

Description

The MAX11600–MAX11617 evaluation system (EV system) includes one master board and one of six EV kit daughter boards. The EV system also includes Windows® 2000-, Windows XP®-, and Windows Vista®-compatible software that provides a simple graphical user interface (GUI) for exercising the features of the MAX11600–MAX11617. The MAX116XXI2CMB+ master board connects to a PC USB port and allows the transfer of I²C commands to the corresponding EV kit daughter board.

The EV kit daughter boards are fully assembled and tested PCBs that demonstrate the capabilities of the MAX11600–MAX11617 4-/8-/12-channel, 8-/10-/12-bit, 3V/5V, low-power, high-speed I²C ADCs with internal reference.

Each EV kit daughter board evaluates three different ADCs, but only the ADC referenced in the EV kit daughter board part name is installed on the board. Contact the factory for free samples of the other pin-compatible ADCs to evaluate these devices or to order individual boards.

Key Features

  • 4/8/12 ADC Channel Inputs
  • 1.7MHz I²C Interface
  • EV Kit Daughter Board Powered by the Master Board
  • Windows 2000-, Windows XP-, and Windows Vista (32-Bit)-Compatible Software
  • Time Domain, Frequency Domain, and Histogram Plotting in the EV System Software
  • Frequency, RMS, Min, Max, and Average DC Calculations in the EV System Software
  • Collects Up to 1 Mega Samples
  • On-Board Voltage Reference
  • USB-PC Connection
  • Proven PCB Layout
  • Fully Assembled and Tested

Applications/Uses

  • Battery-Powered Test Equipment
  • Handheld Portable Applications
  • Medical Instruments
  • Solar-Powered Remote Systems
  • System Supervision

Quality and Environmental Data

Request Reliability Report for: MAX11616EVSYS 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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Related Resources


Electronics in Vehicles (ELIV) 2019
10/16/2019 - 10/17/2019, Bonn, Germany
The international VDI Congress ELIV (Electronics In Vehicles) is THE event for all experts in the field of electrical and electronical car engineering and integration of mechanical and electronical systems.

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