20-Bit, Single-Channel, Ultra-Low-Power, Delta-Sigma ADC with 2-Wire Serial Interface

Experience the Industry's Highest ENOB 20-bit ADC at < 1mW

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The MAX11208 is an ultra-low-power (< 300µA max active current), high-resolution, serial output ADC. This device provides the highest resolution per unit power in the industry and is optimized for applications that require very high dynamic range with low power such as sensors on a 4mA to 20mA industrial control loop. The MAX11208 provides a high-accuracy internal oscillator that requires no external components.

When used with the specified data rates, the internal digital filter provides more than 80dB rejection of 50Hz or 60Hz line noise. The MAX11208 provides a simple 2-wire serial interface in the space-saving, 10-pin µMAX® package. The MAX11208 operates over the -40°C to +85°C temperature range.
MAX11208: Functional Diagram MAX11208: Functional Diagram Enlarge+

Key Features

  • 20-Bit Full-Scale Resolution
    • 20-Bit Noise-Free Resolution at 13.75sps
    • 19-Bit Noise-Free Resolution at 120sps
  • 720nVRMS Noise (MAX11208B)
  • 3ppm INL
  • No Missing Codes
  • Ultra-Low Power Dissipation
    • Operating Mode Current Drain < 300µA (max)
    • Sleep Mode Current Drain < 0.1µA
  • 2.7V to 3.6V Analog Supply Voltage Range
  • 1.7V to 3.6V Digital and I/O Supply Voltage Range
  • Fully Differential Signal Inputs
  • Fully Differential Reference Inputs
  • Internal System Clock
    • 2.4576MHz (MAX11208A)
    • 2.2528MHz (MAX11208B)
  • External Clock
  • Serial 2-Wire Interface (Clock Input and Data Output)
  • On-Demand Offset and Gain Self-Calibration
  • -40°C to +85°C Operating Temperature Range
  • ±2kV ESD Protection
  • Lead(Pb)-Free and RoHS-Compliant µMAX Package


  • Battery Applications
  • Portable Instrumentation
  • Sensor Measurement (Temperature and Pressure)
  • Weigh Scales
Request Reliability Report for: MAX11208 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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