24-/16-Bit, 4-Channel, Simultaneous-Sampling, Cascadable, Sigma-Delta ADCs

Sigma-Delta ADCs Cascadable Up to 32 Simultaneous Channels

Please check latest availability status for a specific part variant.


The MAX11040K/MAX11060 are 24-/16-bit, 4-channel, simultaneous-sampling, sigma-delta analog-to-digital converters (ADCs). The devices allow simultaneous sampling of as many as 32 channels using a built-in cascade feature to synchronize as many as eight devices. The serial interface of the devices allows reading data from all the cascaded devices using a single command. Four modulators simultaneously convert each fully differential analog input with a programmable data output rate ranging from 0.25ksps to 64ksps. The devices achieve 106dB SNR at 16ksps and 117dB SNR at 1ksps (MAX11040K). The devices operate from a single +3V supply. The differential analog input range is ±2.2V when using the internal reference; an external reference is optional. Each input is overvoltage protected up to ±6V without damage. The devices use an internal crystal oscillator or an external source for clock.

The devices are compatible with SPI, QSPI™, MICROWIRE®, and DSP-compatible 4-wire serial interfaces. An on-board interface logic allows one serial interface (with a single chip select) to control up to eight cascaded devices or 32 simultaneous sampling analog input channels.

The devices are ideally suited for power-management systems. Each channel includes an adjustable sampling phase enabling internal compensation for phase shift due to external dividers, transformers, or filters at the inputs. The output data rate is adjustable with a 0.065% resolution (at 16ksps or below) to track the varying frequency of a periodic input. An active-low SYNC input allows periodic alignment of the conversion timing of multiple devices with a remote timing source.

The devices are available in a 38-pin TSSOP package specified over the -40°C to +105°C industrial temperature range.

MAX11040K, MAX11060: Functional Diagram MAX11040K, MAX11060: Functional Diagram Enlarge+

Key Features

  • Feature Set Ideal for Energy Measurement Systems
    • Four Fully Differential Simultaneously Sampled Channels
    • Cascadable for Up to 32 Channels of Simultaneous Sampling
    • Programmable Sampling Phase for Phase Shift Compensation
      • 0 to 333µs in 1.33µs Steps
    • Programmable Output Data Rate with 0.065% Resolution
  • Excellent Performance for High-Accuracy Measurement Applications
    • 117dB SNR at 1ksps
    • 106dB SNR at 16ksps
    • 0.25% Error Over a 1000:1 Dynamic Range
    • ±2.2V Full-Scale Input Range
  • Single-Supply Operation and Protected Inputs for Design Simplicity and Robustness
    • 3.0V to 3.6V Analog Supply Voltage
    • 2.7V to VAVDD Digital Supply Voltage
    • ±6V Overvoltage Protected Inputs
    • -40°C to +105°C Operating Temperature Range


  • Industrial Data-Acquisition Systems
  • Medical Instrumentation
  • Multiphase Power Systems
  • Power-Protection Relay Equipment

See parametric specs for Precision ADCs (< 5Msps) (432)

Part NumberResolution
# Input ChannelsConv. Rate
ADC ArchitectureData BusDiff/S.E. InputInternal VREF
External VREF
External VREF
Bipolar VIN
(ADC)(max)(nominal)(min)(max)(max)(See Notes)
MAX11040K 24464Sigma-DeltaSPIBoth2.
$14.51 @1k
MAX11060 16Diff. Only94.51.5
$5.88 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX11040KDBEVKIT: Evaluation Kit/Daughterboard for the MAX11040K
MAX11040KEVKIT: Evaluation Kit/Daughterboard for the MAX11040K
Product Reliability Reports: MAX11060.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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