DS4106

106.25MHz/212.5MHz/425MHz Clock Oscillators

Fibre Channel Crystal Oscillators Provided in a Miniature 5mm x 3.2mm Ceramic Package


Please check latest availability status for a specific part variant.

Description

The DS4106, DS4212, and DS4425 ceramic surface-mount crystal oscillators are part of Maxim's DS4-XO series of crystal oscillators. These devices offer output frequencies at 106.25MHz, 212.5MHz, and 425MHz. The clock oscillators are suited for systems with tight tolerances because of the jitter, phase noise, and stability performance. The small package provides a format made for applications where PCB space is critical.

These clock oscillators are crystal based and use a fundamental crystal with PLL technology to provide the final output frequencies. Each device is offered with LVDS or LVPECL output types. The output enable pin is active-high logic.

These clock oscillators have very low phase jitter and phase noise. Typical phase jitter is < 0.9ps RMS from 12kHz to 20MHz. The devices are designed to operate with a 3.3V ±10% supply voltage, and are available in a 5.0mm x 3.2mm x 1.49mm, 10-pin LCCC surface-mount ceramic package.
DS4106, DS4212, DS4425: Typical Operating Circuits DS4106, DS4212, DS4425: Typical Operating Circuits Enlarge+

Key Features

  • Clock Output Frequencies:
    • DS4106: 106.25MHz
    • DS4212: 212.50MHz
    • DS4425: 425.00MHz
  • Phase Jitter (RMS): 0.9ps Typical
  • LVPECL or LVDS Output
  • Supply Current:
    • 50mA (Typical, Unloaded) at +3.3V Supply (LVPECL)
    • 53mA (Typical) at +3.3V Supply (LVDS)
  • -40°C to +85°C Temperature Range
  • Output Disable

Applications/Uses

  • Fibre Channel Hard Disk Drives
  • Fibre Channel Switches
  • Host Bus Adapters
  • Raid Controllers

Quality and Environmental Data

Product Reliability Reports: DS4106.pdf 
Lead-Free Package Tin (Sn) Whisker Reports

CAD Symbols and Footprints

  • DS4106AN+
  • DS4106BN+
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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