DS1086L

3.3V Spread-Spectrum EconOscillator

Industry's Smallest Low-EMI 3V, All-Silicon Clock Oscillator Eases Design and Cuts Cost


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Description

The DS1086L EconOscillator™ is a 3.3V programmable clock generator that produces a spread-spectrum (dithered) square-wave output of frequencies from 130kHz to 66.6MHz. The selectable dithered output reduces radiated-emission peaks by dithering the frequency 0.5%, 1%, 2%, 4%, or 8% below the programmed frequency. The DS1086L has a power-down mode and an output-enable control for power-sensitive applications. All the device settings are stored in nonvolatile (NV) EEPROM memory allowing it to operate in stand-alone applications.
DS1086L: Typical Operating Circuit DS1086L: Typical Operating Circuit Enlarge+

Key Features

  • User-Programmable Square-Wave Generator
  • Frequencies Programmable from 130kHz to 66.6MHz
  • 0.5%, 1%, 2%, 4%, or 8% Selectable Dithered Output
  • Adjustable Dither Rate
  • Glitchless Output-Enable Control
  • 2-Wire Serial Interface
  • Nonvolatile Settings
  • 2.7V to 3.6V Supply
  • No External Timing Components Required
  • Power-Down Mode
  • 5kHz Master Frequency Step Size
  • EMI Reduction
  • Industrial Temperature Range: -40°C to +85°C

Applications/Uses

  • Cable Modems
  • Cell Phones
  • Computer Peripherals
  • Copiers
  • PCs
  • Printers
Part NumberfOUT
(MHz)
fOUT
(kHz)
User Prog. fOUTSpread SpectrumVCC
(V)
Reset OutOper. Temp.
(°C)
Package/PinsBudgetary
Price
maxminSee Notes
DS1086L 66130I2CYes2.7 to 3.6No-40 to +85
UMAX/8
$0.95 @1k
See All Silicon Oscillators (17)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.


DS1070K: Oscillator Evaluation Kit
DS1086LPMB1: DS1086LPMB1 Peripheral Module
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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