MAX31D80

Spread-Spectrum Clock Generators

First Spread-Spectrum Clock Generators with Proprietary Active Frequency Dither Adjustment for Best-in-Class EMI Spread


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Description

The MAX31C80/MAX31D80 are spread-spectrum clock generators that contain a phase-locked loop (PLL) that generates a 2MHz to 134MHz clock from an input clock or crystal. The PLL can provide a spread-spectrum down-dithered (MAX31D80) or center-dithered (MAX31C80) frequency-modulated clock. The devices also buffer the incoming clock and provide this output on a separate pin.

The MAX31C80/MAX31D80 are provided in a 10-pin TDFN package and operate over a full -40°C to +125°C automotive temperature range. Devices can be factory programmed for multiple combinations of input and output frequencies (see the Ordering Information table). A low-cost, low-frequency crystal can be used at the input to generate frequencies up to 134MHz.
MAX31C80, MAX31D80: Typical Application Circuit MAX31C80, MAX31D80: Typical Application Circuit Enlarge+

Key Features

  • 2MHz to 134MHz Spread-Spectrum Clock Generator
  • Input Can Be Either an 8MHz to 34MHz Crystal or 8MHz to 134MHz Clock
  • Factory-Programmable Output Frequencies in 2MHz to 134MHz Range
  • Low-Cost Crystal at Low Frequency Used to Generate High Frequencies
  • On-Board PLL is Capable of Spread-Spectrum Frequency Modulation
  • Down- or Center-Dither Spread-Spectrum Frequency Modulation
  • User-Configurable Spread-Spectrum Dither Magnitude
  • Low Cycle-to-Cycle Jitter
  • 3.3V Supply Voltage
  • Temperature Range: -40°C to +125°C
  • Small Package: 10-Pin TDFN (3mm x 3mm x 0.8mm)

Applications/Uses

  • Automotive Infotainment
  • Graphics Cards
  • Printers
  • Set-Top Boxes

Quality and Environmental Data

Product Reliability Reports: MAX31D80.pdf 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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