DS1124

5.0V 8-Bit Programmable Timing Element

Ideal for Delaying the Horizontal Sync (HSYNC) Pulse in Large Format LCD TVs to Achieve Higher Resolution Displays.


Please check latest availability status for a specific part variant.

Description

The DS1124 is an 8-bit programmable timing element similar in function to the DS1021-25. The 256-delay intervals are programmed by using a 3-wire serial interface. With a 0.25ns step size, the DS1124 can provide a delay time from 20ns up to 84ns with an integral nonlinearity of ±3ns.
DS1124: Typical Operating Circuit DS1124: Typical Operating Circuit Enlarge+

Key Features

  • 0.25ns Step Size
  • Leading- and Trailing-Edge Accuracy
  • CMOS/TTL Compatible
  • Can Delay Signals by a Full Period or More
  • 3-Wire Serial Programming Interface
  • Single 5.0V Power Supply
  • 10-pin µSOP Package

Applications/Uses

  • Digital Test Equipment
  • Digital Video Projection
  • LCD Televisions
  • Signal Generators and Analyzers
  • Telecommunications
Part NumberFunctionsProg. StepsProg. Step Size
(ns)
Delay/ PW
(ns)
Delay/ PW
(ns)
Prog. I/FVSUPPLY
(V)
ΔVSUPPLYPackage/PinsBudgetary
Price
minmaxSee Notes
DS1124 Delay Line2560.252083.753-Wire Serial5±5%
UMAX/10
$2.32 @1k
See All Delay Lines (Programmable) (1)
Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

Quality and Environmental Data

Product Reliability Reports: DS1124.pdf 
Lead-Free Package Tin (Sn) Whisker Reports

CAD Symbols and Footprints

  • DS1124U-25+
  • DS1124U-25+T
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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