DS1110L, DS1110LE-175, DS1110LE-350, DS1110LE-400, DS1110LE-450

3V 10-Tap Silicon Delay Line

Please check latest availability status for a specific part variant.


The DS1110L 10-tap delay line is a 3V version of the DS1110. It has 10 equally spaced taps providing delays from 10ns to 500ns. The DS1110L series delay lines provide a nominal accuracy of ±5% or ±2ns, whichever is greater, at 3.3V and +25°C. The DS1110L is characterized to operate from 2.7V to 3.6V. The DS1110L produces both leading- and trailing-edge delays with equal precision. The device is offered in a standard 14-pin TSSOP.
DS1110L: Pin Configuration DS1110L: Pin Configuration Enlarge+

Key Features

  • All-Silicon, 3V, 10-Tap Delay Line
  • Improved, Drop-In Replacement for the DS1110
  • 10 Taps Equally Spaced
  • Delays are Stable and Precise
  • Leading- and Trailing-Edge Accuracy
  • Delay Tolerance ±5% or ±2ns, whichever is Greater, at 3.3V and +25°C
  • Economical
  • Low-Profile 14-Pin TSSOP
  • Low-Power CMOS
  • TTL/CMOS Compatible
  • Vapor Phase and IR Solderable
  • Fast-Turn Prototypes
  • Delays Specified Over Commercial and Industrial Temperature Ranges
  • Custom Delays Available
  • Applications/Uses

    • Automated Test Equipment (ATE)
    • Communication Systems
    • Medical Devices
    • PC Peripheral Devices

    See parametric specs for Delay-Lines (Non-Programmable) (6)

    Part NumberFunctionsTapsTotal Delays
    See Notes
    DS1110L Tapped10100 to 5002.7 to 3.6
    $5.21 @1k

    Pricing Notes:
    This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
    Product Reliability Reports: DS1110L.pdf 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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