Low-Voltage, 4 Ohm, Quad, SPST, CMOS Analog Switches

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The MAX4651/MAX4652/MAX4653 quad analog switches feature 4Ω max on-resistance (RON) when operating from a single +5V supply. RON is matched between switches to 0.2Ω (max) and is flat (0.8Ω max) over the specified signal range. Each switch can handle rail-to-rail analog signals. Off-leakage current is 0.1nA at +25°C. These switches are ideal in low-distortion applications and are the preferred solution over mechanical relays in automated test equipment or applications where current switching is required. They have low power requirements, require less board space, and are more reliable than mechanical relays.

The MAX4651/MAX4652/MAX4653 operate from a single +1.8V to +5.5V supply, making them ideal for use in battery-powered applications.

The MAX4651 has four normally closed (NC) switches, the MAX4652 has four normally open (NO) switches, and the MAX4653 has two NO and two NC switches. These devices are available in 16-pin QFN, TSSOP and SO packages, as well as 20-pin QFN package.
MAX4651, MAX4652, MAX4653: Pin Configuration MAX4651, MAX4652, MAX4653: Pin Configuration Enlarge+

Key Features

  • On-Resistance
    • 4Ω max at 5V
    • 7Ω max at 3V
  • On-Resistance Flatness
    • 0.8Ω max at 5V
    • 2.5Ω max at 3V
  • On-Resistance Matching
    • 0.2Ω max (+2.7V to +5.5V)
  • +1.8V to +5.5V Single-Supply Voltage
  • +1.8V Operation
    • On-Resistance 30Ω (typ) Over Temperature
    • tON 20ns typ, tOFF 12ns (typ)
  • TTL/CMOS-Logic Compatible
  • Crosstalk
    • -100dB at 1MHz
  • Off-Isolation
    • -75dB at 1MHz
  • Rail-to-Rail Signal Range


  • Audio/Video Signal Routing
  • Battery-Powered Applications
  • Communication Systems
  • Low-Voltage Data Acquisition
  • Relay Replacement
  • Sample-and-Hold Circuits

Technical Documents

App Note 3741 Analog ICs for Low Voltage Systems
Request Reliability Report for: MAX4651 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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