Low-Voltage, High-Speed, Quad, SPST CMOS Analog Switches

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The MAX4614/MAX4615/MAX4616 quad, low-voltage, high-speed, single-pole/single-throw (SPST) analog switches are pin compatible with the industry-standard 74HC4066/MAX4610 analog switches. On-resistance (10Ω max) is matched between switches to 1Ω max and is flat (1Ω max) over the specified signal range. Each switch handles V+ to GND analog signal levels. Maximum off-leakage current is only 1nA at TA = +25°C and 6nA at TA = +85°C.

The MAX4614 has four normally open (NO) switches, and the MAX4615 has four normally closed (NC) switches. The MAX4616 has two NO switches and two NC switches. These CMOS switches operate from a single +2V to +5.5V supply. All digital inputs have +0.8V and +2.4V logic thresholds, ensuring TTL/CMOS-logic compatibility when using a single +5V supply.
MAX4614, MAX4615, MAX4616: Pin Configuration MAX4614, MAX4615, MAX4616: Pin Configuration Enlarge+

Key Features

  • Fast Switching Times 12ns tON, 10ns tOFF
  • Pin Compatible with Industry-Standard 74HC4066/MAX4610
  • Guaranteed On-Resistance
    • 10Ω max (+5V supply)
    • 20Ω max (+3V supply)
  • Guaranteed Match Between Channels (1Ω max)
  • Guaranteed Flatness Over Signal Range (1Ω max)
  • < 6nA Off-Leakage Current Over Temperature (TA = +85°C)
  • Rail-to-Rail Signal Handling
  • TTL/CMOS-Logic Compatible


  • Audio/Video Signal Routing
  • Battery-Powered Applications
  • Communication Systems
  • Low-Voltage Data Acquisition
  • Sample-and-Hold Circuits

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.
Product Reliability Reports: MAX4615.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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