Improved, Quad, SPST Analog Switches

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Maxim's redesigned DG411/DG412/DG413 analog switches now feature low on-resistance matching between switches (3Ω max) and guaranteed on-resistance flatness over the signal range (Δ4Ω max). These low on-resistance switches conduct equally well in either direction. They guarantee low charge injection, low power consumption, and an ESD tolerance of 2000V minimum per Method 3015.7. The new design offers lower off-leakage current over temperature (less than 5nA at +85°C).

The DG411/DG412/DG413 are quad, single-pole/single-throw (SPST) analog switches. The DG411 is normally closed (NC), and the DG412 is normally open (NO). The DG413 has two NC switches and two NO switches. Switching times are less than 150ns max for tON and less than 100ns max for tOFF. These devices operate from a single +10V to +30V supply, or bipolar ±4.5V to ±20V supplies. Maxim's improved DG411/DG412/DG413 are fabricated with a 44V silicon-gate process.
DG411, DG412, DG413: Pin Configurations/Functional Diagrams/Truth Tables DG411, DG412, DG413: Pin Configurations/Functional Diagrams/Truth Tables Enlarge+

Key Features

New Features
  • Plug-In Upgrade for Industry-Standard DG411/DG412/DG413
  • Improved RDS(ON) Match Between Channels (3Ω max)
  • Guaranteed RFLAT(ON) Over Signal Range (Δ4Ω)
  • Improved Charge Injection (10pC max)
  • Improved Off-Leakage Current Over Temperature(< 5nA at +85°C)
  • Withstand Electrostatic Discharge (2000V min) per Method 3015.7
Existing Features
  • Low RDS(ON)(35Ω max)
  • Single-Supply Operation +10V to +30V
  • Bipolar-Supply Operation ±4.5V to ±20V
  • Low Power Consumption (35µW max)
  • Rail-to-Rail Signal Handling
  • TTL/CMOS-Logic Compatible


  • Audio Signal Routing
  • Battery-Operated Systems
  • Communication Systems
  • Heads-Up Displays
  • Military Radios
  • Sample-and-Hold Circuits
  • Test Equipment
Product Reliability Reports: DG411.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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