Improved, Dual, High-Speed Analog Switches

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Maxim's redesigned DG401/DG403/DG405 analog switches now feature guaranteed low on-resistance matching between switches (2Ω max) and guaranteed on-resistance flatness over the signal range (3Ω max). These low on-resistance switches (20Ω typ) conduct equally well in either direction and are guaranteed to have low charge injection (15pC max). The new design offers lower off leakage current over temperature (less than 5nA at +85°C).

The DG401/DG403/DG405 are dual, high-speed switches. The single-pole/single-throw DG401 and double-pole/single-throw DG405 are normally open dual switches. The dual, single-pole/double-throw DG403 has two normally open and two normally closed switches. Switching times are 150ns max for tON and 100ns max for tOFF, with a maximum power consumption of 35µW. These devices operate from a single +10V to +30V supply, or bipolar supplies of ±4.5V to ±20V. Maxim's improved DG401/DG403/DG405 are fabricated with a 44V silicon-gate process.
DG401, DG403, DG405: Pin Configurations/Functional Diagrams/Truth Tables DG401, DG403, DG405: Pin Configurations/Functional Diagrams/Truth Tables Enlarge+

Key Features

New Features
  • Plug-In Upgrade for Industry-Standard DG401/DG403/DG405
  • Improved rDS(ON) Match Between Channels (2Ω max)
  • Guaranteed rFLAT(ON) Over Signal Range (3Ω max)
  • Improved Charge Injection (15pC max)
  • Improved Off Leakage Current Over Temperature (<5nA at +85°C)

Existing Features
  • Low rDS(ON) (30Ω max)
  • Single-Supply Operation +10V to +30V
  • Bipolar-Supply Operation ±4.5V to ±20V
  • Low Power Consumption (35µW max)
  • Rail-to-Rail Signal Handling Capability
  • TTL/CMOS-Logic Compatible


  • Audio-Signal Routing
  • Battery-Powered Applications
  • Communication Systems
  • Guidance and Control Systems
  • Heads-Up Displays
  • Military Radios
  • Sample-and-Hold Circuits
  • Test Equipment
Product Reliability Reports: DG403.pdf 
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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