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Fast Dual Driver for ATE with Waveform Shaping

DDR2 Memory Testers, GDDR3, and GDDR4 for ATE Applications Requiring 2Gbps Performance and Waveform Fidelity Control

Product Details

Key Features

Simplified Block Diagram

Technical Docs

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Key Features

  • Terminator/3-Level Driver
  • 2Gbps Toggling at 2VP-P (MAX9957)
  • 2.4Gbps Toggling at 2VP-P (MAX9957D)
  • Voltage-Controlled Waveform Shaping
  • Interfaces Easily With Most Logic Families
  • Low Timing Dispersion

Applications/Uses

  • Automatic Test Equipment: DDR2 Memory Testers, GDDR3, GDDR4

Description

The MAX9957 dual driver IC for automatic test equipment (ATE) memory applications offers three-level drive capability, high-speed switching, low timing dispersion, and features voltage-controlled waveform shaping to enhance edge-placement accuracy and minimize distortion. It also provides tight matching of gain and offset. The MAX9957 buffers reference voltage inputs for each channel with nominal -1V to +3.5V voltage ranges. High-speed differential control inputs, compatible with CML levels, are provided for each channel. Static power dissipation is only 1500mW per channel with nominal -5V and +7V supplies. The MAX9957 power dissipation at 2Gbps toggling is only 1550mW/channel. The MAX9957D power dissipation at 2.4Gbps is only 1850mW/channel.

The MAX9957 is available in a 10mm x 10mm x 1mm, 64-pin TQFP package with an exposed pad, inverted die pad for ease of heat removal.

Simplified Block Diagram

Technical Docs

Support & Training

Search our knowledge base for answers to your technical questions.

Filtered Search

Our dedicated team of Applications Engineers are also available to answer your technical questions. Visit our support portal .