MAX9957

Fast Dual Driver for ATE with Waveform Shaping

DDR2 Memory Testers, GDDR3, and GDDR4 for ATE Applications Requiring 2Gbps Performance and Waveform Fidelity Control


Please check latest availability status for a specific part variant.

Description

The MAX9957 dual driver IC for automatic test equipment (ATE) memory applications offers three-level drive capability, high-speed switching, low timing dispersion, and features voltage-controlled waveform shaping to enhance edge-placement accuracy and minimize distortion. It also provides tight matching of gain and offset. The MAX9957 buffers reference voltage inputs for each channel with nominal -1V to +3.5V voltage ranges. High-speed differential control inputs, compatible with CML levels, are provided for each channel. Static power dissipation is only 1500mW per channel with nominal -5V and +7V supplies. The MAX9957 power dissipation at 2Gbps toggling is only 1550mW/channel. The MAX9957D power dissipation at 2.4Gbps is only 1850mW/channel.

The MAX9957 is available in a 10mm x 10mm x 1mm, 64-pin TQFP package with an exposed pad, inverted die pad for ease of heat removal.

Key Features

  • Terminator/3-Level Driver
  • 2Gbps Toggling at 2VP-P (MAX9957)
  • 2.4Gbps Toggling at 2VP-P (MAX9957D)
  • Voltage-Controlled Waveform Shaping
  • Interfaces Easily With Most Logic Families
  • Low Timing Dispersion

Applications/Uses

  • Automatic Test Equipment: DDR2 Memory Testers, GDDR3, GDDR4

Technical Documents

Tutorial 5100 General Layout Guidelines for RF and Mixed-Signal PCBs
App Note 4338 Cable-Loss Solutions
App Note 4303 Impact of Cable Losses

Quality and Environmental Data

Request Reliability Report for: MAX9957 
Lead-Free Package Tin (Sn) Whisker Reports

CAD Symbols and Footprints

  • MAX9957CCB+D
  • MAX9957DCCB+D
  • Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >

     
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