MAX9611PMB1

MAX9611PMB1 Peripheral Module


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Description

The MAX9611PMB1 peripheral module provides the necessary hardware to interface the MAX9611 current-sense amplifier with 12-bit ADC and op amp, along with the MAX5380 8-bit DAC, to any system that utilizes Pmod™-compatible expansion ports configurable for I²C communication. The IC is configured with an external p-channel FET and a current-sense resistor to form a current-limiting circuit capable of handling currents up to 1A. An 8-bit DAC (U1) is used to set the current-limit point programmatically by the host through the I²C bus. In addition to providing a programmable current-limit function, the ADC within the IC measures the load current/voltage and the set-point voltage that can be read by the host through the I²C bus.

Refer to the MAX9611 IC data sheet for detailed information regarding operation of the IC.

MAX9611PMB1 Board Photo MAX9611PMB1 Board Photo Enlarge+

Key Features

  • Programmable Current Limit Up to 1A
  • Two Current Ranges (Jumper Selectable)
  • Measure and Read Back Load Current, Load Voltage, and Set Point
  • Power Source Up to 30V
  • Jumper-Selectable I²C Address Setting for the MAX9611
  • 6-Pin Pmod-Compatible Connector (I²C)
  • Secondary Header Allows Daisy-Chaining of Additional Modules on the I²C Bus
  • Example Software Written in C for Portability
  • RoHS Compliant
  • Proven PCB Layout
  • Fully Assembled and Tested

Applications/Uses

  • Battery Operated Equipment
  • General Power Supply/Monitoring Applications
  • Handheld Devices
  • Server Backplanes

Technical Documents

User Guide 5483 Analog Essentials Getting Started Guide for Zedboard
Brochure 5468 Maxim Analog Essentials Collection
User Guide 5466 Analog Essentials Getting Started Guide for LX9 and Nexys3

Quality and Environmental Data

Request Reliability Report for: MAX9611PMB1 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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