Dual-Channel, High-Precision, High-Voltage, Current-Sense Amplifier

Unique Combination of High-Accuracy and High-Voltage Operation at 76V

Please check latest availability status for a specific part variant.


The MAX44285 dual-channel high-side current-sense amplifier has precision accuracy specifications of VOS less than 10µV (max) and gain error less than 0.1% (max).

The MAX44285 features an input common-mode voltage range from 2.7V to 76V with 80kHz of small-signal bandwidth, which makes it ideal for interfacing with a SAR ADC for multichannel multiplexed data acquisition systems.

The MAX44285 operates over the -40°C to +125°C temperature range. The MAX44285 is offered in 8-bump WLP and 8-pin µMAX® packages.

MAX44285: Typical Operating Circuit MAX44285: Typical Operating Circuit Enlarge+

Key Features

  • 2.7V to 76V Input Common Mode
  • Low 12µV (max) Input Offset Voltage
  • Low 0.1% (max) Gain Error
  • Gain Options
    • G = 12.5V/V (MAX44285L)
    • G = 20V/V (MAX44285T)
    • G = 50V/V (MAX44285F)
    • G = 100V/V (MAX44285H)
  • 1mm x 2mm 8-Bump WLP and 8-Pin µMAX Packages


  • Base Stations and Communication Equipment
  • Industrial Control and Automation
  • Power Management Systems
  • Server Backplanes

See parametric specs for Current Sense Amplifiers (52)

Part NumberOutput FormatCMVR
Bi-Dir. Curr. SenseVSENSE_FS
VOS @25°C
GainGain Accuracy @25°C
Oper. Temp.
minmaxminmaxrecomm.maxmax@ -3dBSee Notes
MAX44285 Voltage2.7762.75.5No1251020 V/V0.1800-40 to +125
$2.49 @1k

Pricing Notes:
This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific and version-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

MAX44285EVKIT: Evaluation Kit for the MAX44285

Tools & Models

  • MAX44285 Orcad Library
  • Product Reliability Reports: MAX44285.pdf 
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C   Material Composition  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

    Quality Management System >
    Environmental Management System >


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