MAX1351

Dual, High-Side, Current-Sense Amplifiers and Drive Amplifiers


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Description

The MAX1350–MAX1357 offer two programmable high-side current-sense amplifiers and two drive amplifiers integrated in a single package.

The current-sense amplifiers have a 5V to 32V common-mode input range and provide a voltage output that is a multiple of the sense voltage. The common-mode input range is independent of supply voltage. An external sense resistor determines the range of current monitored by a current-sense amplifier. Gains of 2 or 10 are available with a typical input-referred offset voltage of zero or 3mV. The 3mV offset option is ideal for applications where offset nulling is required.

The drive amplifiers provide up to ±10mA of output current capability and a high output capacitive load tolerance. Output transients are limited to ±100mV during power-up and power-down events. The drive amplifiers feature a digitally controllable fast output clamp to ground. The drive amplifier outputs are current limited and are offered with gains of 2 or 4.

The drive amplifiers draw approximately 4.75mA, while the current-sense amplifiers draw approximately 250µA with full-scale sense inputs. In shutdown mode, the total supply current reduces to less than 1µA.

The MAX1350–MAX1357 are available in a 20-pin TSSOP package and operate over the extended (-40°C to +85°C) temperature range.

MAX1350, MAX1351, MAX1352, MAX1353, MAX1354, MAX1355, MAX1356, MAX1357: Typical Application Circuit MAX1350, MAX1351, MAX1352, MAX1353, MAX1354, MAX1355, MAX1356, MAX1357: Typical Application Circuit Enlarge+

Key Features

  • High-Side Current-Sense Amplifier with Gain of 2 or 10
  • ±1% Current-Sense Accuracy
  • Wide 5V to 32V Common-Mode Voltage Range— Independent of Supply Voltage
  • Adjustable Low Noise 0 to 5V or 0 to 10V Output Voltage Ranges with ±10mA Gate Drive
  • Drive Amplifier Features Fast Clamp to Ground

Applications/Uses

  • Cellular Base Stations
  • Industrial Process Control
  • Power Amplifiers
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Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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