ICL7653B

Chopper-Stabilized Op Amps


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Description

Maxim's ICL7650/ICL7653 are chopper-stabilized amplifiers, ideal for low-level signal processing applications. Featuring high performance and versatility, these devices combine low input offset voltage, low input bias current, wide bandwidth, and exceptionally low drift over time and temperature. Low offset is achieved through a nulling scheme that provides continuous error correction. A nulling amplifier alternately nulls itself and the main amplifier. The result is an input offset voltage that is held to a minimum over the entire operating temperature range.

The ICL7650B/ICL7653B are exact replacements for Intersil's ICL7650B/ICL7653B. These devices have a 10µV max offset voltage, a 0.1µV/°C max input offset voltage temperature coefficient, and a 20pA max bias current—all specified over the commercial temperature range.

A 14-pin version is available that can be used with either an internal or external clock. The 14-pin version has an output voltage clamp circuit to minimize overload recovery time.
ICL7650, ICL7650B: Typical Operating Circuit ICL7650, ICL7650B: Typical Operating Circuit Enlarge+

Key Features

  • ICL7650/53 are Improved Second Sources to ICL7650B/53B
  • Lower Supply Current: 2mA
  • Low Offset Voltage: 1µV
  • No Offset Voltage Trimming Needed
  • High-Gain CMRR and PSRR: 120dB min
  • Lower Offset Drift with Time and Temperature
  • Extended Common-Mode Voltage Range
  • Low DC Input Bias Current: 10pA
  • Monolithic, Low-Power CMOS Design

Applications/Uses

  • Condition Amplifier
  • Instrumentation Amplifiers
  • Precision Amplifiers
  • Strain Gauges
  • Thermistors
  • Thermocouples

Quality and Environmental Data

Request Reliability Report for: ICL7653B 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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