Multiple-Output Network Clock Generator

Clock Generator Provides Multiple Clock Outputs Ideal for Network Routers

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The MAX9489 clock generator provides multiple clock outputs, ideal for network routers. The MAX9489 provides 15 buffered clock outputs, each independently programmable to any of 10 individual frequencies: 133MHz, 125MHz, 100MHz, 83MHz, 80MHz, 66MHz, 62.5MHz, 50MHz, 33MHz, or 25MHz. All of the outputs are single-ended LVCMOS. The MAX9489 is controlled through its I²C interface.

At power-up, the frequency of output CLK1 is set by the tri-level input SEL to 100MHz, 125MHz, or 133MHz, while all other outputs are logic low. All outputs are then programmable to any available frequency through the I²C interface. Additionally, all output frequencies are adjustable up or down, by a margin of 5% or 10%, through the I²C interface.

The MAX9489 requires a 25MHz reference that can be either a crystal or an external clock signal. The MAX9489 requires a +3.0V to +3.6V power supply and is available in a 32-pin thin QFN package with an exposed pad for heat removal.
MAX9489: Typical Operating Circuit MAX9489: Typical Operating Circuit Enlarge+

Key Features

  • 15 LVCMOS Outputs with 10 Independently Programmable Frequencies: 133MHz, 125MHz, 100MHz, 83MHz, 80MHz, 66MHz, 62.5MHz, 50MHz, 33MHz, and 25MHz
  • 25MHz Crystal or Clock Input Reference
  • Programmable Through I²C Interface
  • Programmable Output Frequency Margin of ±5% or ±10%
  • Pin-Selectable Power-Up Frequency for CLK1 Output: 100MHz, 125MHz, or 133MHz
  • Low Output Period Jitter: < 48psRMS
  • Output-to-Output Skew < 200ps
  • Available in 32-Lead, 5mm x 5mm x 0.8mm, Thin QFN Package
  • Operates from +3.0V to +3.6V Power Supply
  • Power Dissipation 450mW (typ)
  • Extended Temperature Range: -40°C to +85°C


  • Network Hubs, Switches, Routers
  • Storage Area Networks/Network Attached Storage
  • Telecom/Networking Equipment
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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