MAX4221

330MHz Buffered Video Switches Crosspoint Building Blocks


Please check latest availability status for a specific part variant.

Description

The MAX4111/MAX4121/MAX4221 wideband video switches are optimized for high-definition, broadcast-quality, composite (HDTV, NTSC, PAL, SECAM, and RGB) video switching arrays. Their open-loop buffer amplifiers offer 0.1dB gain flatness to 150MHz. They operate from ±5V supplies and feature differential phase and gain error of only 0.01°/0.01%, respectively. The ultra-low switching glitch (13mV) is positive to avoid confusion with any sync pulse.

Ideal as building blocks in large arrays, these devices feature a constant, high input impedance and a disable function that puts the outputs into a high-impedance state and reduces the operating current to only 250µA. The open-loop architecture allows the outputs to drive capacitive loads without oscillation. Other key features include -92dB crosstalk and -78dB isolation (MAX4121).

The MAX4111/MAX4121/MAX4221 are offered in narrow plastic DIP and SO packages. See the table below for key features:

Part Description Pins
MAX4111 SPST, single-input, single-output switch 8
MAX4121 SPDT, 2-input, single-output switch 8
MAX4221 Dual, SPDT, 2-input, single-output switch 16

Key Features

  • -3dB Bandwidth of 330MHz
  • 0.1dB Gain Flatness of 150MHz
  • 700V/µs Slew Rate
  • 0.01°/0.01% Differential Phase/Gain
  • Low Power: 5.5mA Max
  • -92dB Crosstalk and -78dB Off Isolation at 30MHz
  • High-Z Outputs when Disabled
  • 3pF Input Capacitance
  • Ultra-Low Switching Glitch
  • On-Board Control Logic

Applications/Uses

  • Broadcast/HDTV-Quality Color Signal Multiplexing
  • Data Acquisition
  • Graphics Color-Signal Routing
  • RF and IF Routing
  • Telecom Routing
  • Video-Router and Crosspoint Arrays

Quality and Environmental Data

Request Reliability Report for: MAX4221 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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