MAX1589

Low-Input-Voltage, 500mA LDO Regulator with Active-Low RESET in SOT and TDFN


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Description

The MAX1589 low-dropout linear regulator operates from a +1.62V to +3.6V supply and delivers a guaranteed 500mA continuous load current with a low 175mV dropout. The high-accuracy (±0.5%) output voltage is preset to internally trimmed voltages from +0.75V to +3.0V. An active-low, open-drain reset output remains asserted for at least 70ms after the output voltage reaches regulation. This device is offered in 6-pin thin SOT23 and 6-pin 3mm x 3mm thin DFN packages.

An internal PMOS pass transistor maintains low supply current, independent of load and dropout voltage, making the MAX1589 ideal for portable battery-powered equipment such as personal digital assistants (PDAs), digital still cameras, cell phones, cordless phones, and notebook computers. Other features include logic-controlled shutdown, short-circuit protection, and thermal-overload protection.
MAX1589: Typical Operating Circuit MAX1589: Typical Operating Circuit Enlarge+

Key Features

  • Low 1.62V Minimum Input Voltage
  • Guaranteed 500mA Output Current
  • ±0.5% Initial Accuracy
  • Low 175mV Dropout at 500mA Load
  • 70ms Active-Low RESET Output Flag
  • Supply Current Independent of Load and Dropout Voltage
  • Logic-Controlled Shutdown
  • Thermal-Overload and Short-Circuit Protection
  • Preset Output Voltages (0.75V, 1.0V, 1.2V, 1.3V, 1.5V, 1.8V, 2.5V, and 3.0V)
  • Tiny 6-Pin Thin SOT23 Package (< 1.1mm High)
  • Thin 6-Pin TDFN Package (< 0.8mm High)

Applications/Uses

  • CD and MP3 Players
  • Cellular and PCS Phones
  • Digital Still Cameras
  • Handheld Computers
  • Notebook Computers
  • PCMCIA Cards
  • PDAs and Other Handheld Devices

Quality and Environmental Data

Product Reliability Reports: MAX1589.pdf 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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