DS3050W

3.3V Single-Piece 4Mb Nonvolatile SRAM with Clock


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Description

The DS3050W consists of a static RAM, a nonvolatile (NV) controller, a year 2000-compliant real-time clock (RTC), and an internal rechargeable manganese lithium (ML) battery. These components are encased in a surface-mount module with a 256-ball BGA footprint. Whenever VCC is applied to the module, it recharges the ML battery, powers the clock and SRAM from the external power source, and allows the contents of the clock registers or SRAM to be modified. When VCC is powered down or out-of-tolerance, the controller writeprotects the memory contents and powers the clock and SRAM from the battery. The DS3050W also contains a power-supply monitor output (active-low RST), as well as a user-programmable interrupt output (active-low IRQ/FT).
DS3050W: Typical Operating Circuit DS3050W: Typical Operating Circuit Enlarge+

Key Features

  • Single-Piece, Reflowable, 27mm x 27mm BGA Package Footprint
  • Internal Manganese Lithium Battery and Charger
  • Integrated Real-Time Clock
  • Unconditionally Write-Protects the Clock and SRAM when VCC is Out-of-Tolerance
  • Automatically Switches to Battery Supply when VCC Power Failures Occur
  • Reset Output can be Used as a CPU Supervisor
  • Interrupt Output can be Used as a CPU Watchdog Timer
  • Industrial Temperature Range (-40°C to + 85°C)
  • Applications/Uses

    • Data Acquisition Systems
    • Fire Alarms
    • Gaming
    • Industrial Controllers
    • PLCs
    • POS Terminals
    • RAID Systems and Servers
    • Routers/Switches

    Technical Documents

    App Note 3693 Why Maxim Chose to Design the Single-Piece NV SRAM Modules

    Quality and Environmental Data

    Product Reliability Reports: DS3050W.pdf 
    Lead-Free Package Tin (Sn) Whisker Reports

    Additional Resources

    New Product Press Release 2005-10-31
    Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

    Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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