DS2760K

Li+ Battery Monitor Evaluation Kit


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Description

The DS2760K Evaluation Kit makes performance evaluation, software development, and prototyping with the DS2760 Lithium-Ion Battery Monitor easy. The evaluation board interfaces to an IBM®-compatible PC through a DS9123 Serial Port Adapter and RJ-11 cable connection. The provided CD ROM contains all related data sheets along with the evaluation software, which can be run under Windows® 95, Windows 98 or Windows NT.

The DS2760K evaluation software gives the user complete control of all functions of the DS2760. Separate control tabs allow the user access to all EEPROM and RAM memory locations, all control registers, and real-time updates of all monitored parameters. The software also incorporates a data logging feature to monitor a cell over time and fuel gauging algorithms to improve remaining capacity calculations based on specific cell characteristics.

The evaluation board circuit is designed to provide the DS2760 with accurate parameter measurements, allow the DS2760 to disable charging or discharging, and protect the DS2760 from ESD damage. Kit demonstration boards will vary as they are improved upon over time. For information on the demonstration board circuits refer to the DOCS browser page when auto running from the DS2760K CD ROM or inside the documentation directory on the DS2760K CD ROM.

Key Features

Li + Battery Monitor, including:
  • Temperature measurement
  • Voltage measurement
  • Current measurement
  • Current accumulation
  • Information storage
  • Identification
  • Overvoltage/Undervoltage protection
  • Overcurrent/short circuit protection
  • Interfaces to the serial port of a PC running Windows 95, Windows 98 or Windows NT

Quality and Environmental Data

Request Reliability Report for: DS2760K 
Lead-Free Package Tin (Sn) Whisker Reports
Device   Fab Process   Technology   Sample size   Rejects   FIT at 25°C   FIT at 55°C  

Note : The failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested.

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