Automatic Test Equipment (ATE) refers to any equipment used to perform assembly line type testing of produced items. Generally the term is applied to equipment that is used in testing integrated circuits and printed circuit boards during the manufacturing process. Automatic test equipment can range from small pc-driven dedicated fixed purpose testers to large fully programmable machines that cost millions of dollars.
Test pins connect to a device under test (DUT) and either inject or measure a signal. The speed and resolution of the pin driver and the number of pins supported determine the capability of the test equipment. Our pin drivers were designed primarily for use in semiconductor device test equipment.
This dual, low-power, high-speed, pin electronics driver/comparator/load (DCL) IC includes, for each channel, a three-level pin driver, a dual comparator, variable clamps, and an active load.
This four-channel, ultra-low-power, pin-electronics IC includes a two-level pin driver, a window comparator, a passive load, and force-and-sense Kelvin-switched parametric measurement unit (PMU) connections for each channel.
This fully integrated, high-performance, dual-channel pin electronics IC integrates multiple automatic test equipment (ATE) functions into a single IC, including driver/comparator/load (DCL), parametric measurement unit (PMU), and built-in (16-bit) level-setting digital-to-analog converters (DACs).
Explore our ATE solution to find recommended products for ATE equipment.
|Application Note||5272||Selecting External Components for an Automotive Remote Antenna Regulator and Current-Sense Amplifier|
|Tutorial||4602||Adjusting and Calibrating Out Offset and Gain Error in a Precision DAC|
|Application Note||4338||Cable-Loss Solutions|
|Tutorial||4294||Differential Gain and Phase—Why Measure It, if You Cannot See It?|
|Application Note||4168||Interfacing High-Speed Signals|
|Tutorial||761||Automatic Test Equipment on a Budget|