Bench Characterization of ADCs Using a Low-Cost PC-Based Data-Acquisition Board

Abstract: This application note describes techniques of using a PC based Digital I/O Board to characterize analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL), differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel-to-channel coupling and matching, as well as the supply voltage dependence.