APPLICATION NOTE 4489

Typically Testing “Typical” in a Typical Manner


Abstract: Typical (typ) is typically the most misunderstood word in Integrated Circuit (IC) testing. Typical values can’t be tested directly because they are a statistical value. We discuss how to read a data sheet to understand what parameters are tested and under what conditions. Fabrication (fab) parameters are highlighted including process standard deviation, fab process corners, six sigma quality guard bands, and defective parts per million opportunities (DPMO) concepts.