- Low-Voltage Operation (2.4V to 3.6V)
- Low-Noise, 310µA Single-Chip Sensor Signal Conditioning
- High-Precision Front End Resolves < 400nV of Differential Input Signal
- On-Chip DSP and EEPROM Provide Digital Correction of Sensor Errors
- 16-Bit Signal Path Compensates Sensor Offset and Sensitivity and Associated Temperature Coefficients
- 12-Bit Parallel Digital Output
- Analog Output
- Compensates a Wide Range of Sensor Sensitivity and Offset
- Single-Shot Automated Compensation Algorithm—No Iteration Required
- Built-In Temperature Sensor
- Three-State, 5-Wire Serial Interface Supports High-Volume Manufacturing
The analog front end includes a 2-bit programmable-gain amplifier (PGA) and a 3-bit coarse-offset (CO) DAC, which condition the sensor's output. This coarsely corrected signal is digitized by a 16-bit ADC. The DSP uses the digitized sensor signal, the temperature sensor, and correction coefficients stored in the internal EEPROM to produce the conditioned output.
Multiple or batch manufacturing of sensors is supported with a completely digital test interface. Built-in testability features on the MAX1462 result in the integration of three traditional sensor-manufacturing operations into one automated process:
- Pretest: Data acquisition of sensor performance under the control of a host test computer.
- Calibration and compensation: Computation and storage of calibration and compensation coefficients determined from transducer pretest data.
- Final test operation: Verification of transducer calibration and compensation, without removal from the pretest socket.