ICL7665

微处理器电压监测器,带有双路过压/欠压检测

微处理器电压监控器,提供双门限过压/欠压检测


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说明

The ICL7665 warns microprocessors (µPs) of overvoltage and undervoltage conditions. It draws a typical operating current of only 3µA. The trip points and hysteresis of the two voltage detectors are individually programmed via external resistors to any voltage greater than 1.3V. The ICL7665 will operate from any supply voltage in the 1.6V to 16V range, while monitoring voltages from 1.3V to several hundred volts. The Maxim ICL7665A is an improved version with a 2%-accurate VSET1 threshold and guaranteed performance over temperature.

The 3µA quiescent current of the ICL7665 makes it ideal for voltage monitoring in battery-powered systems. In both battery- and line-powered systems, the unique combination of a reference, two comparators, and hysteresis outputs reduces the size and component count of many circuits.
ICL7665:典型工作电路 ICL7665:典型工作电路 放大+

关键特性

  • µP Over/Undervoltage Warning
  • Improved Second Source
  • Dual Comparator with Precision Internal Reference
  • 3µA Operating Current
  • 2% Threshold Accuracy (ICL7665A)
  • 1.6V to 16V Supply Voltage Range
  • On-Board Hysteresis Outputs
  • Externally Programmable Trip Points
  • Monolithic, Low-Power CMOS Design

应用

  • µP电压监视
  • 备用电池切换
  • 高/低温度、压力、电压报警
  • 低电池检测
  • 过压/欠压保护
  • 电源故障监视
  • 电源失效和跌落检测

请查看具体的参数规格 Supervisors (2 Monitored Voltages) (68)


Part NumberInterfaceReset Thresh.
(V)
Reset OuttRESETWatchdog FeatureSupervisor FeaturesReset Thresh. Accur.
(%)
ICC
(µA)
Package/PinsBudgetary
Price
min@ +25°CmaxSee Notes
ICL7665 R/C Adjustable
1.2 to 1.8
1.8 to 2.5
2.5 to 3.3
3.3 to 5.5
Active High
Active Low
Open Drain
<1msNo Watchdog
Adjustable Reset Input
Overvoltage/Window Monitor
215
CDIP/8
DICE SALES/N
MET.CAN/8
PDIP/8
SOIC (N)/8
$2.87 @1k

Pricing Notes:
价格仅供参考,用于同类产品的比较。所提供报价为美元,需要依汇率折合成人民币。该价格将因当地关税、税率和汇率而异。有关特定订购量和指定版本的报价和供货问题,请参考:价格与供货网站或与指定代理商联系。
产品可靠性报告: ICL7665.pdf 
型号   生产流程   工艺   样本量   不合格   FIT @ 25°C   FIT @ 55°C   Material Composition  

备注: 通过技术手段对故障率进行汇总,并映射到相关的材料部件号。 故障率与被测件的数量密切相关。

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