DS2431-A1

用于汽车应用的1024位、1-Wire EEPROM


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说明

The DS2431-A1 is an AEC-Q100 Grade 1 qualified version of the DS2431. The logical behavior of both versions is identical. The DS2431-A1 is a 1024-bit, 1-Wire® EEPROM chip organized as four memory pages of 256 bits each. Data is written to an 8-byte scratchpad, verified, and then copied to the EEPROM memory. As a special feature, the four memory pages can individually be write protected or put in EPROM-emulation mode, where bits can only be changed from a 1 to a 0 state. The DS2431-A1 communicates over the single-conductor 1-Wire bus. The communication follows the standard 1-Wire protocol. Each device has its own unalterable and unique 64-bit ROM registration number that is factory lasered into the chip. The registration number is used to address the device in a multidrop 1-Wire net environment.

关键特性

  • 1024 Bits of EEPROM Memory Partitioned Into Four Pages of 256 Bits
  • Individual Memory Pages Can Be Permanently Write Protected or Put in EPROM-Emulation Mode ("Write to 0")
  • Switchpoint Hysteresis and Filtering to Optimize Performance in the Presence of Noise
  • IEC 1000-4-2 Level 4 ESD Protection (+8kV Contact, +15kV Air, Typ)
  • Reads and Writes Over a 4.5V to 5.25V Voltage Range from -40°C to +125°C
  • Communicates to Host with a Single Digital Signal at 15.4kbps Using 1-Wire Protocol
  • Meets AEC-Q100 Grade 1 Qualification Requirements
  • Also Available as Standard Version for Industrial Temperature Range (DS2431)

应用

  • 配件/PCB识别
  • 汽车电缆组件识别
  • 汽车传感器识别,校准数据存储
Part NumberMemory TypeMemory SizeBus TypeVSUPPLY
(V)
Package/PinsBudgetary
Price
maxSee Notes
DS2431-A1 EEPROM1K x 11-Wire5.25
TSOC/6
$1.56 @1k
查看所有Memory (EPROM, EEPROM, ROM, NV SRAM) (52)
Pricing Notes:
价格仅供参考,用于同类产品的比较。所提供报价为美元,需要依汇率折合成人民币。该价格将因当地关税、税率和汇率而异。有关特定订购量和指定版本的报价和供货问题,请参考:价格与供货网站或与指定代理商联系。

技术资料

应用笔记 5507 Understanding the DS1WM Synthesizable 1-Wire Bus Master

质量和环境数据

申请可靠性报告: DS2431-A1 
无铅封装的锡(Sn)晶须报告
型号   生产流程   工艺   样本量   不合格   FIT @ 25°C   FIT @ 55°C  

备注: 通过技术手段对故障率进行汇总,并映射到相关的材料部件号。 故障率与被测件的数量密切相关。

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