MAX6325

1ppm/°C、低噪声、+2.5V/+4.096V/+5V电压基准


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说明

The MAX6325/MAX6341/MAX6350 are low-noise, precision voltage references with extremely low, 0.5ppm/°C typical temperature coefficients and excellent, ±0.02% initial accuracy. These devices feature buried-zener technology for lowest noise performance. Load-regulation specifications are guaranteed for source and sink currents up to 15mA. Excellent line and load regulation and low output impedance at high frequencies make them ideal for high-resolution data-conversion systems up to 16 bits.

The MAX6325 is set for a 2.500V output, the MAX6341 is set for a 4.096V output, and the MAX6350 is set for a 5.000V output. All three provide for the option of external trimming and noise reduction.

关键特性

  • Ultra-Low, 1ppm/°C Max Tempco
  • Very Low, 1.5µVp-p Noise (0.1Hz to 10Hz) (MAX6325)
  • ±0.02% Initial Accuracy (MAX6350)
  • ±15mA Output Source and Sink Current
  • Low, 18mW Power Consumption (MAX6325)
  • Industry-Standard Pinout
  • Optional Noise Reduction and Voltage Trim
  • Excellent Transient Response
  • 8-Pin SO Package Available
  • Low, 30ppm/1000h Long-Term Stability
  • Stable for All Capacitive Loads

应用

  • 自动测试设备(ATE)
  • 数字电压表
  • 高精度工业与过程控制
  • 高精度基准
  • 高分辨率A/D与D/A转换器
  • 精密电流源
Part NumberVOUT
(V)
Temp. Coeff.
(ppm/°C)
Initial Accuracy
(% max)
Calibration MethodISUPPLY
(µA)
VSUPPLY
(V)
VSUPPLY
(V)
Noise 0.1Hz to 10Hz
(µVpp)
Oper. Temp.
(°C)
Package/PinsBudgetary
Price
max@ +25°CmaxminmaxtypSee Notes
MAX6325 2.510.04Trim30008361.5
-55 to +125
-40 to +85
0 to +70
CDIP/8
PDIP/8
SOIC (N)/8
$9.54 @1k
MAX6341 4.0960.0232002.4
PDIP/8
SOIC (N)/8
$8.45 @1k
MAX6350 50.0233003
CDIP/8
PDIP/8
SOIC (N)/8
$8.45 @1k
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Pricing Notes:
价格仅供参考,用于同类产品的比较。所提供报价为美元,需要依汇率折合成人民币。该价格将因当地关税、税率和汇率而异。有关特定订购量和指定版本的报价和供货问题,请参考:价格与供货网站或与指定代理商联系。

CAD Symbols and Footprints

  • MAX6325CPA+
  • MAX6325CSA+
  • MAX6325CSA+T
  • MAX6325EPA+
  • MAX6325ESA+
  • MAX6325ESA+T
  • MAX6325MJA
  • 型号   生产流程   工艺   样本量   不合格   FIT @ 25°C   FIT @ 55°C  

    备注: 通过技术手段对故障率进行汇总,并映射到相关的材料部件号。 故障率与被测件的数量密切相关。

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